000			02219nam a2200385Ia 4500
001			35919
003			0000000000
005			20250407092814.0
007			cr mnu
008			931116s1993 caua tb 100 0 eng d
020			_a081863880X (paper)
020			_a0818638818 (microfiche)
020			_a0818638826 (case)
035			_a(OCoLC)29335795
040			_aAFM _cAFM
111	0		_aIEEE Computer Society Conference on Computer Vision and Pattern Recognition _d(1993 : _cNew York, New York)
245	0	0	_aProceedings : _b1993 IEEE Computer Society Conference on Computer Vision and Pattern Recognition : June 15-18, 1993, New York City, New York / _csponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.
260			_aLos Alamitos, California : _bIEEE Computer Society Press, _cc1993.
300			_axviii, 804 pages : _bIllustrations ; _c28 cm.
500			_a"IEEE catalog number 93CH3309-2"--T.p. verso.
500			_a"IEEE Computer Society Press order number 3880-02"--T.p. verso.
500			_aSpine title: Proceedings, computer vision '93 and pattern recognition.
500			_aTitle on p. facing t.p.: Proceedings OOOO, CVOO, PR '93.
504			_aIncludes bibliographies.
505	0		_aRecognition -- Low-level vision -- Active vision -- Navigation -- Segmentation.
530			_aOnline version also available to IEEE Xplore subscribers.
533			_aMicrofiche. _b[Piscataway, N.J. : _cIEEE Service Center, Institute of electrical and Electronic Engineers, _d1993]. _e9 microfiches ; 11 x 15 cm.
650	1	0	_aComputer vision _xCongresses.
650	1	0	_aPattern recognition systems _xCongresses.
710	0		_aIEEE Computer Society. _bTechnical Committee on Pattern Analysis and Machine Intelligence.
740	0		_a1993 IEEE Computer Society Conference on Computer Vision and Pattern Recognition : June 15-18, 1993, New York City, New York.
740	0		_aProceedings OOOO, CVOO, PR '93.
740	0		_aProceedings, computer vision '93 and pattern recognition.
999			_c4626 _d4626