MARC details
000 -LEADER |
fixed length control field |
02219nam a2200385Ia 4500 |
001 - CONTROL NUMBER |
control field |
35919 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
0000000000 |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20250407092814.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
fixed length control field |
cr mnu |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
931116s1993 caua tb 100 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
081863880X (paper) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0818638818 (microfiche) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0818638826 (case) |
035 ## - SYSTEM CONTROL NUMBER |
System control number |
(OCoLC)29335795 |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
AFM |
Transcribing agency |
AFM |
111 0# - MAIN ENTRY--MEETING NAME |
Meeting name or jurisdiction name as entry element |
IEEE Computer Society Conference on Computer Vision and Pattern Recognition |
Date of meeting or treaty signing |
(1993 : |
Location of meeting |
New York, New York) |
245 00 - TITLE STATEMENT |
Title |
Proceedings : |
Remainder of title |
1993 IEEE Computer Society Conference on Computer Vision and Pattern Recognition : June 15-18, 1993, New York City, New York / |
Statement of responsibility, etc. |
sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
Los Alamitos, California : |
Name of publisher, distributor, etc. |
IEEE Computer Society Press, |
Date of publication, distribution, etc. |
c1993. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xviii, 804 pages : |
Other physical details |
Illustrations ; |
Dimensions |
28 cm. |
500 ## - GENERAL NOTE |
General note |
"IEEE catalog number 93CH3309-2"--T.p. verso. |
500 ## - GENERAL NOTE |
General note |
"IEEE Computer Society Press order number 3880-02"--T.p. verso. |
500 ## - GENERAL NOTE |
General note |
Spine title: Proceedings, computer vision '93 and pattern recognition. |
500 ## - GENERAL NOTE |
General note |
Title on p. facing t.p.: Proceedings OOOO, CVOO, PR '93. |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc. note |
Includes bibliographies. |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Recognition -- Low-level vision -- Active vision -- Navigation -- Segmentation. |
530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE |
Additional physical form available note |
Online version also available to IEEE Xplore subscribers. |
533 ## - REPRODUCTION NOTE |
Type of reproduction |
Microfiche. |
Place of reproduction |
[Piscataway, N.J. : |
Agency responsible for reproduction |
IEEE Service Center, Institute of electrical and Electronic Engineers, |
Date of reproduction |
1993]. |
Physical description of reproduction |
9 microfiches ; 11 x 15 cm. |
650 10 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Computer vision |
General subdivision |
Congresses. |
650 10 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Pattern recognition systems |
General subdivision |
Congresses. |
710 0# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
IEEE Computer Society. |
Subordinate unit |
Technical Committee on Pattern Analysis and Machine Intelligence. |
740 0# - ADDED ENTRY--UNCONTROLLED RELATED/ANALYTICAL TITLE |
Uncontrolled related/analytical title |
1993 IEEE Computer Society Conference on Computer Vision and Pattern Recognition : June 15-18, 1993, New York City, New York. |
740 0# - ADDED ENTRY--UNCONTROLLED RELATED/ANALYTICAL TITLE |
Uncontrolled related/analytical title |
Proceedings OOOO, CVOO, PR '93. |
740 0# - ADDED ENTRY--UNCONTROLLED RELATED/ANALYTICAL TITLE |
Uncontrolled related/analytical title |
Proceedings, computer vision '93 and pattern recognition. |